{"id":8554,"date":"2023-05-16T13:07:53","date_gmt":"2023-05-16T10:07:53","guid":{"rendered":"https:\/\/www.micl.co.il\/?post_type=product&#038;p=8554"},"modified":"2023-05-16T13:25:10","modified_gmt":"2023-05-16T10:25:10","slug":"fr-education","status":"publish","type":"product","link":"https:\/\/www.micl.co.il\/product\/fr-education","title":{"rendered":"FR-Education &#8211; Film Measurement System for Educational Laboratories"},"content":{"rendered":"<p>FR-Education tool is controlled through F<strong>R-Monitor\u2122<\/strong> performing the spectral data acquisition and analysis. A material database is included and can be easily expanded by the user. The entire system (hardware &#8211; software) is shipped ready for measurements. The only additional part needed is a PC with a free USB port. The system can be easily used by anyone with basic computer skills without any deep knowledge of optics.<\/p>\n<p>The FR-Education tool can handle layer stacks consisted of numerous layers and two quantities can be calculated simultaneously e.g. thicknesses of two films, thickness and n &amp; k of one film.<\/p>\n<p><strong>FR-Education<\/strong> is a simplified version of FR-Basic with case Type A, without a cover top. In this configuration the spectrometer has 650 pixels, and thus the film thickness range can be measured is limited. FR-Education comes with a Reflection Probe, two (2) fibers, and a film\/cuvette holder for Absorbance\/Transmittance measurements in standard 1cm cuvettes and films.<br \/>\nA special holder accommodating two reference samples (silicon and aluminum) and Si wafer pieces with various films (SiO2, Si3N4\/SiO2, poly-Si\/Si3N4\/SiO2) is provided as a reference, while optical absorbance standards can be provided on request.<\/p>\n<p><strong>Applications<\/strong>:<\/p>\n<ul>\n<li>Polymer<\/li>\n<li>Characterization<\/li>\n<li>Hardcoats<\/li>\n<li>Chemical<\/li>\n<li>Measurements<\/li>\n<li>Biomedical<\/li>\n<li>Semiconductor<\/li>\n<li>Non-Metal Films<\/li>\n<li>Optical Coating<\/li>\n<\/ul>\n<p><strong>Specifications* <\/strong>:<br \/>\n<strong>Thickness<\/strong>: 100nm \u2013 30\u03bcm<br \/>\n<strong>Wavelength range<\/strong>: 360-1000nm<br \/>\n<strong>Detector<\/strong>: 650 pixels Si CCD array, 12Bit A\/D resolution<br \/>\n<strong>Accuracy<\/strong>: better than 1 %<br \/>\n<strong>Spot size<\/strong>: &gt;0.5mm<br \/>\n<strong>Light Source<\/strong>: Regulated Tungsten &#8211; Halogen (360nm &#8211; 2000nm)<br \/>\n<strong>Sample size<\/strong>: 10 &#8211; 150mm, irregular shape<br \/>\n<strong>Computer requirements<\/strong>: PC with Windows XP\/Vista\/7 32\/64bit and a USB port available<br \/>\n<strong>Power requirements<\/strong>: 110V\/230V AC<br \/>\n<strong>Dimensions<\/strong> (WxLxH): 32cm x 36cm x 18cm**<br \/>\n<strong>Weight<\/strong>: 9.2Kg<\/p>\n<p>* Specifications are subject to change without any notice.<br \/>\n** Without the reflactance holder.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>FR-Education is a low-cost table-top solution for typical optical measurements (Absorbance\/Transmittance, Reflectance, Fluorescence) and non destructive measurement of Film thickness and optical properties(n &amp; k) of thin and thick single film or multilayer stacks.<br \/>\nFilm thickness and optical properties measurement, is based on White Light Reflectance Spectroscopy (WLRS).<br \/>\nIn WLRS, the reflectance spectrum in the 350-100nm range due to the interferences at the interfaces of the film(s) is collected with the embedded spectrometer and then fitted with the multi-layer reflectance equation to derive the thickness, the refractive index and roughness of the film(s).<\/p>\n","protected":false},"featured_media":8556,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"product_cat":[355],"product_tag":[],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v22.0 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>FR-Education - Film Measurement System for Educational Laboratories - MICL Group<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.micl.co.il\/product\/fr-education\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"FR-Education - Film Measurement System for Educational Laboratories - MICL Group\" \/>\n<meta property=\"og:description\" content=\"FR-Education is a low-cost table-top solution for typical optical measurements (Absorbance\/Transmittance, Reflectance, Fluorescence) and non destructive measurement of Film thickness and optical properties(n &amp; k) of thin and thick single film or multilayer stacks. Film thickness and optical properties measurement, is based on White Light Reflectance Spectroscopy (WLRS). In WLRS, the reflectance spectrum in the 350-100nm range due to the interferences at the interfaces of the film(s) is collected with the embedded spectrometer and then fitted with the multi-layer reflectance equation to derive the thickness, the refractive index and roughness of the film(s).\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.micl.co.il\/product\/fr-education\" \/>\n<meta property=\"og:site_name\" content=\"MICL Group\" \/>\n<meta property=\"article:publisher\" content=\"https:\/\/www.facebook.com\/MICLGroupIL\" \/>\n<meta property=\"article:modified_time\" content=\"2023-05-16T10:25:10+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.micl.co.il\/wp-content\/uploads\/2023\/05\/FR-Education-Thetametrisis.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"1000\" \/>\n\t<meta property=\"og:image:height\" content=\"1000\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.micl.co.il\/product\/fr-education\",\"url\":\"https:\/\/www.micl.co.il\/product\/fr-education\",\"name\":\"FR-Education - Film Measurement System for Educational Laboratories - MICL Group\",\"isPartOf\":{\"@id\":\"https:\/\/www.micl.co.il\/#website\"},\"datePublished\":\"2023-05-16T10:07:53+00:00\",\"dateModified\":\"2023-05-16T10:25:10+00:00\",\"breadcrumb\":{\"@id\":\"https:\/\/www.micl.co.il\/product\/fr-education#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.micl.co.il\/product\/fr-education\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.micl.co.il\/product\/fr-education#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.micl.co.il\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Shop\",\"item\":\"https:\/\/www.micl.co.il\/shop\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"FR-Education &#8211; Film Measurement System for Educational Laboratories\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.micl.co.il\/#website\",\"url\":\"https:\/\/www.micl.co.il\/\",\"name\":\"MICL Group\",\"description\":\"\",\"publisher\":{\"@id\":\"https:\/\/www.micl.co.il\/#organization\"},\"alternateName\":\"Supports a variety of semiconductor industries\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.micl.co.il\/?s={search_term_string}\"},\"query-input\":\"required name=search_term_string\"}],\"inLanguage\":\"en-US\"},{\"@type\":\"Organization\",\"@id\":\"https:\/\/www.micl.co.il\/#organization\",\"name\":\"MICL Group\",\"url\":\"https:\/\/www.micl.co.il\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/www.micl.co.il\/#\/schema\/logo\/image\/\",\"url\":\"https:\/\/www.micl.co.il\/wp-content\/uploads\/2022\/12\/MICL-logo-2022.png\",\"contentUrl\":\"https:\/\/www.micl.co.il\/wp-content\/uploads\/2022\/12\/MICL-logo-2022.png\",\"width\":1000,\"height\":1000,\"caption\":\"MICL Group\"},\"image\":{\"@id\":\"https:\/\/www.micl.co.il\/#\/schema\/logo\/image\/\"},\"sameAs\":[\"https:\/\/www.facebook.com\/MICLGroupIL\",\"https:\/\/www.linkedin.com\/company\/micl-high-tech-technologies\/\",\"https:\/\/www.youtube.com\/channel\/UCN_6eH8hMdhWz7TDsRya31Q\"]}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"FR-Education - Film Measurement System for Educational Laboratories - MICL Group","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.micl.co.il\/product\/fr-education","og_locale":"en_US","og_type":"article","og_title":"FR-Education - Film Measurement System for Educational Laboratories - MICL Group","og_description":"FR-Education is a low-cost table-top solution for typical optical measurements (Absorbance\/Transmittance, Reflectance, Fluorescence) and non destructive measurement of Film thickness and optical properties(n &amp; k) of thin and thick single film or multilayer stacks. Film thickness and optical properties measurement, is based on White Light Reflectance Spectroscopy (WLRS). 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