The FR-ES can be employed in a wide range of diverse applications, such as: Film thickness, Refractive Index, Color, Transmittance, Reflectance, and many more. There are three configurations available: VIS\/NIR (370 – 1020 nm), NIR-N1 (850 – 1050 nm), NIR (900 – 1700 nm).<\/p>\n
Then, there is a wide range of accessories, such as:<\/p>\n
Filters to block light at certain spectral regimes
\nFR-Mic for measurements at very small areas
\nManual stage, either 25 x 25 mm or 100 x 100 mm or 200 x 200 mm
\nFilm\/Cuvette Holder for Absorbance \/ Transmittance and chemical concentration measurements
\nIntegration Spheres for diffuse & total reflectance
\nBy the combination of different modules, the final setup meets any end-user needs.<\/p>\n
Applications<\/strong>:<\/p>\n Features<\/strong>:<\/p>\n Principle of operation<\/strong>:<\/p>\n White Light Reflectance Spectroscopy (WLRS) measures the amount of light reflected from a film or a multilayer stack over a spectral range, with the incident light normal (perpendicular) to the sample surface. <\/p>\n","protected":false},"excerpt":{"rendered":" The FR-ES is a compact and light-weighted unit for the characterization of coatings. With FR-ES the user can perform reflectance and transmittance measurements in the 370 – 1700 nm spectral range.\n
\nAnd many more…<\/li>\n<\/ul>\n\n
\nThe measured reflectance spectrum, produced by interference from the individual interfaces is being used to determine the thickness, optical constants (n & k), etc. of free-standing and supported (on transparent or partially\/fully reflective substrates) stack of films.<\/p>\n
\nThe FR-ES platform is designed to provide excellent performance in terms of the characterization of coatings.<\/p>\n","protected":false},"featured_media":8563,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"product_cat":[355],"product_tag":[],"acf":[],"yoast_head":"\n